Multi-Angle Beam Scanning Transmission Electron Microscopy for Diffraction-Contrast-Free Magnetic Imaging
Abstract
Recent development of the differential phase contrast (DPC) scanning transmission electron microscopy (STEM) technique has significantly advanced materials science supported by high-sensitivity detectors and powerful data processing. Especially the 4D-STEM technique, employing a pixelated camera as a STEM detector, enables extensive information acquisition through post-processing of large datasets. However, magnetic or electric field imaging using DPC is often disturbed by diffraction contrasts intrinsic to the crystalline material. In this paper, we demonstrate elimination of the diffraction contrasts for magnetic field imaging by using angularly distributed multiple electron beams generated by a multi-hole aperture within the 4D-STEM framework. This multi-angle beam configuration suppresses irrelevant crystalline contrast and yields direct magnetic information with high sensitivity from the specimen. Furthermore, we performed various image analysis to extract and interpret magnetic domain structures and domain walls.
Related
- STEM-Bank-26: An Open Dataset of Analytical Scanning Transmission Electron Microscopy Images and Spectra
- Multi-techniques characterisation of anti-reflective Ta2O5 and TaOxNy thin films deposited by reactive sputtering: coupling X-ray photoelectron spectroscopy, scanning/transmission electron microscopy and ion beam analysis
- Sub-diffraction-resolved spatial distribution of emitting excitons in scanning tunneling microscopy-induced luminescence of two-dimensional semiconductors via Richardson-Lucy deconvolution
- Scanning through space and time: past, present, and future of time-resolved scanning transmission soft X-ray microscopy
- Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations
BibTeX
@misc{yasuhara2026multiangle,
title = {{Multi-Angle Beam Scanning Transmission Electron Microscopy for Diffraction-Contrast-Free Magnetic Imaging}},
author = {Akira Yasuhara and Zentaro Akase and Takumi Sannomiya},
howpublished = {arXiv},
year = {2026},
month = sep,
doi = {10.48550/arxiv.2609.03303},
eprint = {2609.03303},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2609.03303},
}
RIS
TY - UNPB
TI - Multi-Angle Beam Scanning Transmission Electron Microscopy for Diffraction-Contrast-Free Magnetic Imaging
AU - Akira Yasuhara
AU - Zentaro Akase
AU - Takumi Sannomiya
PY - 2026
DA - 2026/09/03
PB - arXiv
DO - 10.48550/arxiv.2609.03303
UR - https://arxiv.org/abs/2609.03303
AB - Recent development of the differential phase contrast (DPC) scanning transmission electron microscopy (STEM) technique has significantly advanced materials science supported by high-sensitivity detectors and powerful data processing. Especially the 4D-STEM technique, employing a pixelated camera as a STEM detector, enables extensive information acquisition through post-processing of large datasets. However, magnetic or electric field imaging using DPC is often disturbed by diffraction contrasts intrinsic to the crystalline material. In this paper, we demonstrate elimination of the diffraction contrasts for magnetic field imaging by using angularly distributed multiple electron beams generated by a multi-hole aperture within the 4D-STEM framework. This multi-angle beam configuration suppresses irrelevant crystalline contrast and yields direct magnetic information with high sensitivity from the specimen. Furthermore, we performed various image analysis to extract and interpret magnetic domain structures and domain walls.
ER -