The shift paradigm in photovoltaic reliability: A critical review of degradation
Abstract
Over time, photovoltaic (PV) systems have spread globally, with long-term reliability being a crucial element for the economic viability of solar energy. However, numerous approaches in the field of research and commerce address failures that cause module degradation, such as micro-cracks, Potential-Induced Degradation (PID), delamination, and corrosion, among others, as independent phenomena. This analysis reveals that, due to the fragmented perspective where each fault is considered individually, it fails to capture the system's nature and the interrelations between detected faults in real-world arrangements. This study, based on a systematic review of 111 peer-reviewed investigations, uses the PRISMA methodology and a bibliometric map (using VOSviewer) to examine the predominant fault paths and their interrelationships. The analysis indicate that deterioration occurs through interrelated cascades -mechanical, chemical, polymeric, and electrical- where one mode of failure tends to trigger or accelerate others. These cascades are rarely captured by standardized tests, yet they govern field performance outcomes. In addition, the analysis reveals significant gaps in research and field circumstances, as well as long-term uncertainty regarding novel materials and the demand for predictive diagnostics. The present article proposes, by reinterpreting photovoltaic reliability as a systemic challenge, a unified approach that merges cutting-edge materials, interdisciplinary diagnostic tools, and long-term field validation. This transformation is essential: crystalline silicon modules currently degrade at a median rate of 0.5%/year, and without systemic reliability strategies, cumulative losses over a 25-year lifespan represent a significant threat to the economic viability of utility-scale solar investments.
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BibTeX
@article{sotto2026shift,
title = {{The shift paradigm in photovoltaic reliability: A critical review of degradation}},
author = {Diego Andrés González Sotto and Mohamed Moussa El Idi and Arnaud Maillard},
journal = {Next Materials},
year = {2026},
month = sep,
doi = {10.1016/j.nxmate.2026.102587},
url = {https://hal.science/hal-05744460v1},
note = {CC BY},
}
RIS
TY - JOUR
TI - The shift paradigm in photovoltaic reliability: A critical review of degradation
AU - Diego Andrés González Sotto
AU - Mohamed Moussa El Idi
AU - Arnaud Maillard
PY - 2026
DA - 2026/09/09
JO - Next Materials
DO - 10.1016/j.nxmate.2026.102587
UR - https://hal.science/hal-05744460v1
AB - Over time, photovoltaic (PV) systems have spread globally, with long-term reliability being a crucial element for the economic viability of solar energy. However, numerous approaches in the field of research and commerce address failures that cause module degradation, such as micro-cracks, Potential-Induced Degradation (PID), delamination, and corrosion, among others, as independent phenomena. This analysis reveals that, due to the fragmented perspective where each fault is considered individually, it fails to capture the system's nature and the interrelations between detected faults in real-world arrangements. This study, based on a systematic review of 111 peer-reviewed investigations, uses the PRISMA methodology and a bibliometric map (using VOSviewer) to examine the predominant fault paths and their interrelationships. The analysis indicate that deterioration occurs through interrelated cascades -mechanical, chemical, polymeric, and electrical- where one mode of failure tends to trigger or accelerate others. These cascades are rarely captured by standardized tests, yet they govern field performance outcomes. In addition, the analysis reveals significant gaps in research and field circumstances, as well as long-term uncertainty regarding novel materials and the demand for predictive diagnostics. The present article proposes, by reinterpreting photovoltaic reliability as a systemic challenge, a unified approach that merges cutting-edge materials, interdisciplinary diagnostic tools, and long-term field validation. This transformation is essential: crystalline silicon modules currently degrade at a median rate of 0.5%/year, and without systemic reliability strategies, cumulative losses over a 25-year lifespan represent a significant threat to the economic viability of utility-scale solar investments.
SN - 2949-8228
ER -