Low Contrast Absorber Localization in Heat Pipe Microreactors Using Physics Informed Muon Tomography for Reactivity Monitoring
Abstract
Microreactors require nonintrusive monitoring methods that can provide information about internal control states without opening or modifying the sealed system. In heat pipe microreactors, rotating control drums regulate reactivity by changing the angular orientation of neutron absorber coatings around the reflector region. This study applies the previously developed μTRec muon scattering tomography framework to absorber coating localization in the heat pipe microreactor geometry. Momentum informed M-value imaging is used with the spectrometer information to evaluate whether the angular orientation of absorber coatings on twelve control drums can be inferred from reconstructed muon scattering images. Two absorber materials are considered. Hafnium is used as a high contrast reference case, while boron carbide, B4C, is used as the primary low contrast case because its density is close to that of the surrounding beryllium reflector. Both laser generated and cosmic ray muon sources are evaluated for absorber-in and absorber-out drum configurations. The reconstructed transverse images and one dimensional drum profiles show clear hafnium localization with both source types. For B4C, absorber localization is achieved with the controlled laser generated source when the number of events is increased, while the cosmic ray case remains limited by weak absorber contrast and artifacts near high scattering regions. The study defines the imaging conditions under which μTRec based M-value tomography can support control drum absorber localization for passive microreactor monitoring. These findings also support safeguards by design by informing the selection of absorber and reflector materials, dimensions, and coating thickness that improve nonintrusive detectability.
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BibTeX
@misc{ughade2026contrast,
title = {{Low Contrast Absorber Localization in Heat Pipe Microreactors Using Physics Informed Muon Tomography for Reactivity Monitoring}},
author = {Reshma Ughade and Stylianos Chatzidakis},
howpublished = {arXiv},
year = {2026},
month = nov,
doi = {10.48550/arxiv.2611.00276},
eprint = {2611.00276},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2611.00276},
note = {CC BY 4.0},
}
RIS
TY - UNPB
TI - Low Contrast Absorber Localization in Heat Pipe Microreactors Using Physics Informed Muon Tomography for Reactivity Monitoring
AU - Reshma Ughade
AU - Stylianos Chatzidakis
PY - 2026
DA - 2026/11/01
PB - arXiv
DO - 10.48550/arxiv.2611.00276
UR - https://arxiv.org/abs/2611.00276
AB - Microreactors require nonintrusive monitoring methods that can provide information about internal control states without opening or modifying the sealed system. In heat pipe microreactors, rotating control drums regulate reactivity by changing the angular orientation of neutron absorber coatings around the reflector region. This study applies the previously developed μTRec muon scattering tomography framework to absorber coating localization in the heat pipe microreactor geometry. Momentum informed M-value imaging is used with the spectrometer information to evaluate whether the angular orientation of absorber coatings on twelve control drums can be inferred from reconstructed muon scattering images. Two absorber materials are considered. Hafnium is used as a high contrast reference case, while boron carbide, B_4C, is used as the primary low contrast case because its density is close to that of the surrounding beryllium reflector. Both laser generated and cosmic ray muon sources are evaluated for absorber-in and absorber-out drum configurations. The reconstructed transverse images and one dimensional drum profiles show clear hafnium localization with both source types. For B_4C, absorber localization is achieved with the controlled laser generated source when the number of events is increased, while the cosmic ray case remains limited by weak absorber contrast and artifacts near high scattering regions. The study defines the imaging conditions under which μTRec based M-value tomography can support control drum absorber localization for passive microreactor monitoring. These findings also support safeguards by design by informing the selection of absorber and reflector materials, dimensions, and coating thickness that improve nonintrusive detectability.
ER -