Diffractive Refractometer Based on Scalar Theory
Abstract
The measurement of the refractive index typically requires the use of optical ellipsometry which, although potentially very accurate, is extremely sensitive to the structural properties of the sample and its theoretical modeling, and typically requires specialized expertise to obtain reliable output data. Here, we propose a simple diffractive method for the measurement of the refractive index of homogenous solid thin films, which requires only the structuring of the surface of the material to be measured with the profile of a diffraction grating. The refractive index of an exemplary soft-moldable material is successfully estimated over a wide wavelength range by simply incorporating the measured topography and diffraction efficiency of the grating into a convenient scalar theory-based diffraction model. Without the need for specialized expertise and equipment, the method can serve as a simple and widely accessible optical characterization of materials useful in material science and photonics applications.
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BibTeX
@article{salvatore2026diffractive,
title = {{Diffractive Refractometer Based on Scalar Theory}},
author = {Marcella Salvatore and Francesco Reda and Fabio Borbone and I Komang Januariyasa and Pasqualino Maddalena and Stefano Luigi Oscurato},
journal = {Polymers},
year = {2026},
month = oct,
doi = {10.3390/polym15071605},
url = {https://hal.science/hal-05789715v1},
note = {CC BY},
}
RIS
TY - JOUR
TI - Diffractive Refractometer Based on Scalar Theory
AU - Marcella Salvatore
AU - Francesco Reda
AU - Fabio Borbone
AU - I Komang Januariyasa
AU - Pasqualino Maddalena
AU - Stefano Luigi Oscurato
PY - 2026
DA - 2026/10/09
JO - Polymers
DO - 10.3390/polym15071605
UR - https://hal.science/hal-05789715v1
AB - The measurement of the refractive index typically requires the use of optical ellipsometry which, although potentially very accurate, is extremely sensitive to the structural properties of the sample and its theoretical modeling, and typically requires specialized expertise to obtain reliable output data. Here, we propose a simple diffractive method for the measurement of the refractive index of homogenous solid thin films, which requires only the structuring of the surface of the material to be measured with the profile of a diffraction grating. The refractive index of an exemplary soft-moldable material is successfully estimated over a wide wavelength range by simply incorporating the measured topography and diffraction efficiency of the grating into a convenient scalar theory-based diffraction model. Without the need for specialized expertise and equipment, the method can serve as a simple and widely accessible optical characterization of materials useful in material science and photonics applications.
SN - 2073-4360
ER -