Peer-reviewedCC BYNanomaterials (Basel, Switzerland)
Correlative SEM–AFM Characterization of 2D Materials: From Sequential Measurements to In-Situ Multimodal Platforms
- 1School of Physics, Beihang University, Beijing 100191, China
- 2School of Cyber Science and Technology, Beihang University, Beijing 100191, China
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BibTeX
@article{wu2026correlative,
title = {{Correlative SEM–AFM Characterization of 2D Materials: From Sequential Measurements to In-Situ Multimodal Platforms}},
author = {Xuan Wu and Wenping Li and Shu Li and Zhe Wang and Wei Cai and Shouzheng Guo and Xunan Ran and Junying Zhang},
journal = {Nanomaterials (Basel, Switzerland)},
year = {2026},
month = sep,
url = {https://europepmc.org/article/PMC/PMC13666913},
note = {CC BY},
}
RIS
TY - JOUR
TI - Correlative SEM–AFM Characterization of 2D Materials: From Sequential Measurements to In-Situ Multimodal Platforms
AU - Xuan Wu
AU - Wenping Li
AU - Shu Li
AU - Zhe Wang
AU - Wei Cai
AU - Shouzheng Guo
AU - Xunan Ran
AU - Junying Zhang
PY - 2026
DA - 2026/09/22
JO - Nanomaterials (Basel, Switzerland)
UR - https://europepmc.org/article/PMC/PMC13666913
SN - 2079-4991
ER -