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Peer-reviewedCC BYNanomaterials (Basel, Switzerland)

Correlative SEM–AFM Characterization of 2D Materials: From Sequential Measurements to In-Situ Multimodal Platforms

  1. 1School of Physics, Beihang University, Beijing 100191, China
  2. 2School of Cyber Science and Technology, Beihang University, Beijing 100191, China

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BibTeX
@article{wu2026correlative,
  title = {{Correlative SEM–AFM Characterization of 2D Materials: From Sequential Measurements to In-Situ Multimodal Platforms}},
  author = {Xuan Wu and Wenping Li and Shu Li and Zhe Wang and Wei Cai and Shouzheng Guo and Xunan Ran and Junying Zhang},
  journal = {Nanomaterials (Basel, Switzerland)},
  year = {2026},
  month = sep,
  url = {https://europepmc.org/article/PMC/PMC13666913},
  note = {CC BY},
}
RIS
TY  - JOUR
TI  - Correlative SEM–AFM Characterization of 2D Materials: From Sequential Measurements to In-Situ Multimodal Platforms
AU  - Xuan Wu
AU  - Wenping Li
AU  - Shu Li
AU  - Zhe Wang
AU  - Wei Cai
AU  - Shouzheng Guo
AU  - Xunan Ran
AU  - Junying Zhang
PY  - 2026
DA  - 2026/09/22
JO  - Nanomaterials (Basel, Switzerland)
UR  - https://europepmc.org/article/PMC/PMC13666913
SN  - 2079-4991
ER  -