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Peer-reviewedCC BYAdvanced science (Weinheim, Baden-Wurttemberg, Germany)

Physics-Guided Multi-Channel Restoration for Efficient and Accurate Atomic Force Microscopy Imaging.

2 more authors
8 affiliations
  1. 1School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, Republic of Korea.
  2. 2Department of Applied Data Science, Sungkyunkwan University (SKKU), Suwon, Republic of Korea.
  3. 3Department of Semiconductor and Display Engineering, Sungkyunkwan University (SKKU), Suwon, Republic of Korea.
  4. 4Department of Materials Science and Engineering, Korea University, Seoul, Republic of Korea.
  5. 5Samsung Advanced Institute of Technology, Suwon, Republic of Korea.
  6. 6National Nano Fab Center (NNFC), Daejeon, Republic of Korea.
  7. 7School of Materials Science and Engineering, Yeungnam University, Gyeongsan, Gyeongbuk, Republic of Korea.
  8. 8Korea Research Institute of Standards and Science (KRISS), Daejeon, Republic of Korea.

Abstract

Scientific imaging instruments often acquire multiple physically complementary signals within a single measurement. In atomic force microscopy (AFM), high-throughput imaging requires higher scan speeds, however, image quality is fundamentally limited by multiple distortions. These artifacts are further amplified for sharp nano/microstructures, making accurate image restoration inherently challenging. Most deep learning-based approaches rely on a single primary channel and improve performance by increasing model complexity or training data. Here, we introduce a physics-guided multi-channel input approach for AFM that utilizes co-acquired auxiliary signals to improve image restoration efficiency and accuracy. We construct a four co-acquired channel input, each containing complementary physical information. By integrating these channels into a lightweight convolutional neural network, the proposed approach significantly improves restoration quality with minimal additional parameters. At a scan rate of 7.0 Hz, the four-channel DnCNN achieved higher reconstruction accuracy than a single-channel Restormer with approximately 47 times as many parameters, while providing approximately 24 times faster inference. Across the evaluated EFM and PFM conditions, four-channel inputs reduced the training-patch requirement by approximately two to three times at matched PSNR.

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BibTeX
@article{sung2026physicsguided,
  title = {{Physics-Guided Multi-Channel Restoration for Efficient and Accurate Atomic Force Microscopy Imaging.}},
  author = {Jaeuk Sung and Hongseok Kim and Seungjae Heo and Jin Tae Moon and Jangwoo Ko and Panithan Sriboriboon and Dong-Gyu Lee and Sanghyun Jo and Hee Han and Jungho Ryu and Woo Lee and Jinseong Heo and Hyun-Cheol Song and Yunseok Kim},
  journal = {Advanced science (Weinheim, Baden-Wurttemberg, Germany)},
  year = {2026},
  month = oct,
  doi = {10.1002/advs.78289},
  url = {https://europepmc.org/article/MED/42893507},
  note = {CC BY},
}
RIS
TY  - JOUR
TI  - Physics-Guided Multi-Channel Restoration for Efficient and Accurate Atomic Force Microscopy Imaging.
AU  - Jaeuk Sung
AU  - Hongseok Kim
AU  - Seungjae Heo
AU  - Jin Tae Moon
AU  - Jangwoo Ko
AU  - Panithan Sriboriboon
AU  - Dong-Gyu Lee
AU  - Sanghyun Jo
AU  - Hee Han
AU  - Jungho Ryu
AU  - Woo Lee
AU  - Jinseong Heo
AU  - Hyun-Cheol Song
AU  - Yunseok Kim
PY  - 2026
DA  - 2026/10/18
JO  - Advanced science (Weinheim, Baden-Wurttemberg, Germany)
DO  - 10.1002/advs.78289
UR  - https://europepmc.org/article/MED/42893507
AB  - Scientific imaging instruments often acquire multiple physically complementary signals within a single measurement. In atomic force microscopy (AFM), high-throughput imaging requires higher scan speeds, however, image quality is fundamentally limited by multiple distortions. These artifacts are further amplified for sharp nano/microstructures, making accurate image restoration inherently challenging. Most deep learning-based approaches rely on a single primary channel and improve performance by increasing model complexity or training data. Here, we introduce a physics-guided multi-channel input approach for AFM that utilizes co-acquired auxiliary signals to improve image restoration efficiency and accuracy. We construct a four co-acquired channel input, each containing complementary physical information. By integrating these channels into a lightweight convolutional neural network, the proposed approach significantly improves restoration quality with minimal additional parameters. At a scan rate of 7.0 Hz, the four-channel DnCNN achieved higher reconstruction accuracy than a single-channel Restormer with approximately 47 times as many parameters, while providing approximately 24 times faster inference. Across the evaluated EFM and PFM conditions, four-channel inputs reduced the training-patch requirement by approximately two to three times at matched PSNR.
SN  - 2198-3844
ER  -