Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics

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BibTeX

@article{anon2026unifying,
  title = {{Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics}},
  journal = {Micromachines},
  year = {2026},
  month = sep,
  url = {https://europepmc.org/article/PMC/PMC13707354},
  note = {CC BY},
}

RIS

TY  - JOUR
TI  - Unifying Field and Temperature Acceleration in Semiconductor Device Reliability Through Entropic Kinetics
PY  - 2026
DA  - 2026/09/24
JO  - Micromachines
UR  - https://europepmc.org/article/PMC/PMC13707354
SN  - 2072-666X
ER  -

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