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Peer-reviewedPublisher termsOptics Express

Spatially resolving multiple layer thicknesses in thin films with an optical in-line roll-to-roll characterization setup

  • Søren A. R. Kynde
  • Astrid T. Rømer
  • Abdelouadoud Mammeri1
  • Jens W. Andreasen1
  • Moises Espindola2
  • Matteo Ciambezi
  • Søren A. Jensen
  1. 1Technical University of Denmark
  2. 2F. Junckers Industrier A/S
Open at sourceDOICite

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Cite

BibTeXRIS
BibTeX
@article{kynde2026spatially,
  title = {{Spatially resolving multiple layer thicknesses in thin films with an optical in-line roll-to-roll characterization setup}},
  author = {Søren A. R. Kynde and Astrid T. Rømer and Abdelouadoud Mammeri and Jens W. Andreasen and Moises Espindola and Matteo Ciambezi and Søren A. Jensen},
  journal = {Optics Express},
  year = {2026},
  month = oct,
  doi = {10.1364/oe.610134},
  url = {https://opg.optica.org/abstract.cfm?URI=oe-34-22-41153},
}
RIS
TY  - JOUR
TI  - Spatially resolving multiple layer thicknesses in thin films with an optical in-line roll-to-roll characterization setup
AU  - Søren A. R. Kynde
AU  - Astrid T. Rømer
AU  - Abdelouadoud Mammeri
AU  - Jens W. Andreasen
AU  - Moises Espindola
AU  - Matteo Ciambezi
AU  - Søren A. Jensen
PY  - 2026
DA  - 2026/10/20
JO  - Optics Express
DO  - 10.1364/oe.610134
UR  - https://opg.optica.org/abstract.cfm?URI=oe-34-22-41153
SN  - 1094-4087
ER  -