PreprintarXiv licencearXiv
Limitations of Debye-Waller lattice temperature extraction under electronic excitation
Abstract
Ultrafast diffraction is the cutting-edge technique to extract the atomic temperature at femtosecond timescales, and further related quantities - in particular, electron-phonon coupling strength at elevated electronic temperatures. The present work demonstrates limitations of such an analysis, emphasizing the importance of careful evaluation of the evolution of the Debye temperature. It is shown that, due to the sensitivity of the Debye-Waller analysis to this parameter, neglecting its changes under electronic excitation may lead to significant deviations of the atomic temperature extracted from its true values.
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BibTeX
@misc{medvedev2026limitations,
title = {{Limitations of Debye-Waller lattice temperature extraction under electronic excitation}},
author = {N. Medvedev and M. Kopecky and J. Chalupsky and L. Juha},
howpublished = {arXiv},
year = {2026},
month = oct,
doi = {10.48550/arxiv.2605.15140},
eprint = {2605.15140},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2605.15140},
}
RIS
TY - UNPB
TI - Limitations of Debye-Waller lattice temperature extraction under electronic excitation
AU - N. Medvedev
AU - M. Kopecky
AU - J. Chalupsky
AU - L. Juha
PY - 2026
DA - 2026/10/23
PB - arXiv
DO - 10.48550/arxiv.2605.15140
UR - https://arxiv.org/abs/2605.15140
AB - Ultrafast diffraction is the cutting-edge technique to extract the atomic temperature at femtosecond timescales, and further related quantities - in particular, electron-phonon coupling strength at elevated electronic temperatures. The present work demonstrates limitations of such an analysis, emphasizing the importance of careful evaluation of the evolution of the Debye temperature. It is shown that, due to the sensitivity of the Debye-Waller analysis to this parameter, neglecting its changes under electronic excitation may lead to significant deviations of the atomic temperature extracted from its true values.
ER -