Photoluminescence of resin-based solder flux residue under ultraviolet excitation from 120 nm to 310 nm
Abstract
Nuisance photoluminescence is a potential source of background in particle detectors that use noble liquids as target material for galactic dark matter particles and neutrinos. Liquid argon and xenon scintillate in the vacuum ultraviolet (VUV) wavelength range in response to particle interactions. Photoluminescent materials that absorb these photons can cause unexpected signals that may impede event reconstruction in these detectors. We illuminated residue from different types of commercial solder flux commonly used in liquid xenon detectors with ultraviolet and VUV light and measured their photoluminescence spectra and intensities. We find that all tested flux residues photoluminesce in the visible spectral region when exposed to VUV light.
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BibTeX
@misc{hurhina2026photoluminescence,
title = {{Photoluminescence of resin-based solder flux residue under ultraviolet excitation from 120 nm to 310 nm}},
author = {Anna Hurhina and Marjolein Troost and Andreas Leonhardt and Tina R. Pollmann},
howpublished = {arXiv},
year = {2026},
month = sep,
doi = {10.48550/arxiv.2605.16845},
eprint = {2605.16845},
archivePrefix = {arXiv},
url = {https://arxiv.org/abs/2605.16845},
}
RIS
TY - UNPB
TI - Photoluminescence of resin-based solder flux residue under ultraviolet excitation from 120 nm to 310 nm
AU - Anna Hurhina
AU - Marjolein Troost
AU - Andreas Leonhardt
AU - Tina R. Pollmann
PY - 2026
DA - 2026/09/30
PB - arXiv
DO - 10.48550/arxiv.2605.16845
UR - https://arxiv.org/abs/2605.16845
AB - Nuisance photoluminescence is a potential source of background in particle detectors that use noble liquids as target material for galactic dark matter particles and neutrinos. Liquid argon and xenon scintillate in the vacuum ultraviolet (VUV) wavelength range in response to particle interactions. Photoluminescent materials that absorb these photons can cause unexpected signals that may impede event reconstruction in these detectors. We illuminated residue from different types of commercial solder flux commonly used in liquid xenon detectors with ultraviolet and VUV light and measured their photoluminescence spectra and intensities. We find that all tested flux residues photoluminesce in the visible spectral region when exposed to VUV light.
ER -