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Peer-reviewedCC BY 4.0Nanomaterials

Linking Stoichiometry, Chemical Pressure, and Domain Structure in the van der Waals Ferrielectric CuInP2S6

4 affiliations
  1. 1HUN-REN Wigner Research Centre for Physics, Konkoly-Thege Miklós út 29-33, 1121 Budapest, Hungary
  2. 2Institute of Physics, University of Pécs, Ifjúság útja. 6, 7624 Pécs, Hungary
  3. 3Department of Atomic Physics, Institute of Physics, Budapest University of Technology and Economics, Műegyetem rkp. 3, 1111 Budapest, Hungary
  4. 4Department of the Physics of Semiconductors, Uzhhorod National University, 54 Voloshina Str., 88000 Uzhhorod, Ukraine

Abstract

The ferrielectric properties of layered CuInP2S6 (CIPS) are highly sensitive to stoichiometry and growth-induced defects. Here we systematically compare crystals grown by chemical vapor transport and the Bridgman–Stockbarger method with Cu- and In-enriched samples, combining compositional analysis, dielectric spectroscopy, uniaxial-pressure measurements, Raman spectroscopy, piezoresponse force microscopy and first-principles calculations. The transition temperature increases systematically from 307 K (Bridgman) to 312 K (Cu-enriched), 317 K (gas transport) and 322 K (In-enriched). In enrichment is consistent with spontaneous CIPS/In4/3P2S6 phase segregation that generates effective positive chemical pressure, stabilizing the ferrielectric state and producing a strongly biased, pinned domain configuration. Cu enrichment produces the opposite response—lower TC, enhanced dielectric loss and a fragmented domain morphology—characteristic of a negative-pressure-like perturbation of the Cu-ion energy landscape. Landau–Ginzburg–Devonshire analysis and density functional calculations provide a unified microscopic picture based on Cu-ion configurational freedom and interlayer coupling. Growth defects act as an independent source of domain-wall pinning. Together, these results establish stoichiometry and synthesis conditions as practical tools for engineering ferrielectric order in van der Waals CIPS.

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BibTeX
@article{gal2026linking,
  title = {{Linking Stoichiometry, Chemical Pressure, and Domain Structure in the van der Waals Ferrielectric CuInP2S6}},
  author = {Dávid Gál and Sándor Lenk and István Rigó and Miklós Veres and László Péter and Anton Kohutych and Konstantin Glukhov and Nyomó Dominika and Alexander Molnar},
  journal = {Nanomaterials},
  year = {2026},
  month = oct,
  doi = {10.3390/nano16211336},
  url = {https://www.mdpi.com/2079-4991/16/21/1336},
  note = {CC BY 4.0},
}
RIS
TY  - JOUR
TI  - Linking Stoichiometry, Chemical Pressure, and Domain Structure in the van der Waals Ferrielectric CuInP2S6
AU  - Dávid Gál
AU  - Sándor Lenk
AU  - István Rigó
AU  - Miklós Veres
AU  - László Péter
AU  - Anton Kohutych
AU  - Konstantin Glukhov
AU  - Nyomó Dominika
AU  - Alexander Molnar
PY  - 2026
DA  - 2026/10/22
JO  - Nanomaterials
DO  - 10.3390/nano16211336
UR  - https://www.mdpi.com/2079-4991/16/21/1336
AB  - The ferrielectric properties of layered CuInP2S6 (CIPS) are highly sensitive to stoichiometry and growth-induced defects. Here we systematically compare crystals grown by chemical vapor transport and the Bridgman–Stockbarger method with Cu- and In-enriched samples, combining compositional analysis, dielectric spectroscopy, uniaxial-pressure measurements, Raman spectroscopy, piezoresponse force microscopy and first-principles calculations. The transition temperature increases systematically from 307 K (Bridgman) to 312 K (Cu-enriched), 317 K (gas transport) and 322 K (In-enriched). In enrichment is consistent with spontaneous CIPS/In4/3P2S6 phase segregation that generates effective positive chemical pressure, stabilizing the ferrielectric state and producing a strongly biased, pinned domain configuration. Cu enrichment produces the opposite response—lower TC, enhanced dielectric loss and a fragmented domain morphology—characteristic of a negative-pressure-like perturbation of the Cu-ion energy landscape. Landau–Ginzburg–Devonshire analysis and density functional calculations provide a unified microscopic picture based on Cu-ion configurational freedom and interlayer coupling. Growth defects act as an independent source of domain-wall pinning. Together, these results establish stoichiometry and synthesis conditions as practical tools for engineering ferrielectric order in van der Waals CIPS.
SN  - 2079-4991
ER  -