Alteration of X‐Ray Emission Band Spectrum Under Bragg Diffraction
Abstract
We use a Zr/Si multilayer presenting a gradient of period to probe the shape of the Si L2,3 emission band (maximum around 92 eV) in and out of Bragg conditions. The sample was prepared by magnetron sputtering and its reflectance measured in the photon energy range of interest with synchrotron radiation. The study is performed on an electron microprobe equipped with a reflection zone plate spectrometer operating in the 40-120 eV photon energy range. Outside Bragg conditions, the observed spectrum is that of amorphous silicon as expected from the small thickness of the Si layers. In Bragg conditions, that is to say when the period of the multilayer, the emitted photon energy and detection angle fulfill the Bragg law, the shape and intensity of the emission band change. The main change is the intensity decrease of the shoulder present around 97 eV. Purcell-Kleppner and Kossel effects, or a combination of both, are suggested to explain the evolution of the L2,3 emission band when going through the Bragg conditions.
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BibTeX
@article{jonnard2026alteration,
title = {{Alteration of X‐Ray Emission Band Spectrum Under Bragg Diffraction}},
author = {Philippe Jonnard and Jean‐michel André and Karine Le Guen and Nawel Temmar and Anthony Boucly and Nicolas Rividi and Wanqiu Bai and Angelo Giglia and Nicola Mahne and Sheng Guo and Jingtao Zhu},
journal = {X-Ray Spectrometry},
year = {2026},
month = aug,
doi = {10.1002/xrs.70100},
url = {https://hal.science/hal-05731974v1},
note = {CC BY 4.0},
}
RIS
TY - JOUR
TI - Alteration of X‐Ray Emission Band Spectrum Under Bragg Diffraction
AU - Philippe Jonnard
AU - Jean‐michel André
AU - Karine Le Guen
AU - Nawel Temmar
AU - Anthony Boucly
AU - Nicolas Rividi
AU - Wanqiu Bai
AU - Angelo Giglia
AU - Nicola Mahne
AU - Sheng Guo
AU - Jingtao Zhu
PY - 2026
DA - 2026/08/31
JO - X-Ray Spectrometry
DO - 10.1002/xrs.70100
UR - https://hal.science/hal-05731974v1
AB - We use a Zr/Si multilayer presenting a gradient of period to probe the shape of the Si L2,3 emission band (maximum around 92 eV) in and out of Bragg conditions. The sample was prepared by magnetron sputtering and its reflectance measured in the photon energy range of interest with synchrotron radiation. The study is performed on an electron microprobe equipped with a reflection zone plate spectrometer operating in the 40-120 eV photon energy range. Outside Bragg conditions, the observed spectrum is that of amorphous silicon as expected from the small thickness of the Si layers. In Bragg conditions, that is to say when the period of the multilayer, the emitted photon energy and detection angle fulfill the Bragg law, the shape and intensity of the emission band change. The main change is the intensity decrease of the shoulder present around 97 eV. Purcell-Kleppner and Kossel effects, or a combination of both, are suggested to explain the evolution of the L2,3 emission band when going through the Bragg conditions.
SN - 0049-8246
SN - 1097-4539
ER -