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Peer-reviewedLicence not statedNanomaterials

Defect characterization of the SiO\textsubscript2/Si interface investigated by drift-assisted positron annihilation lifetime spectroscopy

  • Michael Mayerhofer
  • Kangho Lee
  • Georg S Duesberg
  • Günther Dollinger
  • Marcel Dickmann
  • Ricardo Helm
  • Werner Egger
  • Catherine Corbel
  • Peter Sperr
  • Maik Butterling
  • Andreas Wagner
  • Maciej Oskar Liedke
2 more authors
  • Eric Hirschmann
  • Johannes Mitteneder
Open at sourceDOICite

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Cite

BibTeXRIS
BibTeX
@article{mayerhofer2026defect,
  title = {{Defect characterization of the SiO\textsubscript2/Si interface investigated by drift-assisted positron annihilation lifetime spectroscopy}},
  author = {Michael Mayerhofer and Kangho Lee and Georg S Duesberg and Günther Dollinger and Marcel Dickmann and Ricardo Helm and Werner Egger and Catherine Corbel and Peter Sperr and Maik Butterling and Andreas Wagner and Maciej Oskar Liedke and Eric Hirschmann and Johannes Mitteneder},
  journal = {Nanomaterials},
  year = {2026},
  month = sep,
  doi = {10.3390/nano16030156},
  url = {https://hal.science/hal-05771171v1},
}
RIS
TY  - JOUR
TI  - Defect characterization of the SiO\textsubscript2/Si interface investigated by drift-assisted positron annihilation lifetime spectroscopy
AU  - Michael Mayerhofer
AU  - Kangho Lee
AU  - Georg S Duesberg
AU  - Günther Dollinger
AU  - Marcel Dickmann
AU  - Ricardo Helm
AU  - Werner Egger
AU  - Catherine Corbel
AU  - Peter Sperr
AU  - Maik Butterling
AU  - Andreas Wagner
AU  - Maciej Oskar Liedke
AU  - Eric Hirschmann
AU  - Johannes Mitteneder
PY  - 2026
DA  - 2026/09/30
JO  - Nanomaterials
DO  - 10.3390/nano16030156
UR  - https://hal.science/hal-05771171v1
SN  - 2079-4991
SN  - 2079-4991
ER  -