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Peer-reviewedCC BY-NC-ND 4.0ACS Nano

Single-Shot Polarization Imaging of Vectorial Metasurfaces Using Cross-Grating Wavefront Microscopy

  • Julien Flamant1
  • Baptiste Marthy2
  • Khosro Zangeneh Kamali3
  • Nathan Ullberg2
  • Guillaume Demesy2
  • Patrick Ferrand2
  • Mikael Käll3
  • Guillaume Baffou2
  1. 1Université de Lorraine, CNRS, CRAN, Nancy F-54000, France
  2. 2Aix-Marseille University, CNRS, Centrale Med, Institut Fresnel, Marseille 13013, France
  3. 3Department of Physics, Chalmers University of Technology, Gothenburg 412 96, Sweden
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Abstract

Nanophotonics and optical microscopy are now tightly intertwined in modern research, as high-resolution optical characterization is essential for studying nanomaterials, such as dielectric and plasmonic nanoparticles, metasurfaces, and 2D materials. Yet, existing microscopy techniques are often complex to implement or limited to measuring light intensity, overlooking spectral, phase, and polarization features. Here, we report an optical microscopy approach capable of retrieving the full complex vectorial electromagnetic field at the image plane (that is, intensity, phase, and polarization of light) in a single acquisition. The method combines a polarization-sensitive camera with a two-dimensional diffraction grating (cross-grating) placed in close proximity to the image sensor. Beyond light beam characterization, we show how this configuration enables sample characterization in two image acquisitions, through Jones matrix imaging, from which we derive the complex transmittance tensor of metasurfaces. This accessible technique, easy to implement in any preexisting microscope, offers a comprehensive metrology platform for advanced studies of metasurfaces and 2D materials, in line with the growing interest in polarization-resolved nanophotonics.

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Cite

BibTeXRIS
BibTeX
@article{flamant2026singleshot,
  title = {{Single-Shot Polarization Imaging of Vectorial Metasurfaces Using Cross-Grating Wavefront Microscopy}},
  author = {Julien Flamant and Baptiste Marthy and Khosro Zangeneh Kamali and Nathan Ullberg and Guillaume Demesy and Patrick Ferrand and Mikael Käll and Guillaume Baffou},
  journal = {ACS Nano},
  year = {2026},
  month = oct,
  doi = {10.1021/acsnano.6c06635},
  url = {https://hal.science/hal-05845703v1},
  note = {CC BY-NC-ND 4.0},
}
RIS
TY  - JOUR
TI  - Single-Shot Polarization Imaging of Vectorial Metasurfaces Using Cross-Grating Wavefront Microscopy
AU  - Julien Flamant
AU  - Baptiste Marthy
AU  - Khosro Zangeneh Kamali
AU  - Nathan Ullberg
AU  - Guillaume Demesy
AU  - Patrick Ferrand
AU  - Mikael Käll
AU  - Guillaume Baffou
PY  - 2026
DA  - 2026/10/15
JO  - ACS Nano
DO  - 10.1021/acsnano.6c06635
UR  - https://hal.science/hal-05845703v1
AB  - Nanophotonics and optical microscopy are now tightly intertwined in modern research, as high-resolution optical characterization is essential for studying nanomaterials, such as dielectric and plasmonic nanoparticles, metasurfaces, and 2D materials. Yet, existing microscopy techniques are often complex to implement or limited to measuring light intensity, overlooking spectral, phase, and polarization features. Here, we report an optical microscopy approach capable of retrieving the full complex vectorial electromagnetic field at the image plane (that is, intensity, phase, and polarization of light) in a single acquisition. The method combines a polarization-sensitive camera with a two-dimensional diffraction grating (cross-grating) placed in close proximity to the image sensor. Beyond light beam characterization, we show how this configuration enables sample characterization in two image acquisitions, through Jones matrix imaging, from which we derive the complex transmittance tensor of metasurfaces. This accessible technique, easy to implement in any preexisting microscope, offers a comprehensive metrology platform for advanced studies of metasurfaces and 2D materials, in line with the growing interest in polarization-resolved nanophotonics.
SN  - 1936-0851
SN  - 1936-086X
ER  -