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Peer-reviewedCC BY-NC-ND 4.0Physica B: Condensed Matter

Post-deposition control of the defect landscape in CdIn2S4 thin films

Abstract

We investigate the effect of post-deposition annealing on the defect-controlled electronic response of CdIn2S4 thin films using photocurrent-light-intensity analysis and transient photoconductivity. Relative to our previous annealing study, the present work extracts characteristic energy scales of the effective sub-bandgap states sampled under illumination and relates them to annealing-induced Fermi-level shifts. The determined characteristic energies are in the range of 40-16 meV and systematically evolve as a result of annealing. The measured Lux-Ampere characteristics evolve systematically from linear to sublinear behavior and, within the Rose and Bube formalisms, are consistent with reorganization of inversion-related antisite states and sulfur-vacancy-related defects. In the as-grown and vacuum-annealed films, the results support a distributed contribution of E states. Because the accessible energy window is limited by illumination range and Fermi-level position, the reconstructed profiles are interpreted as effective rather than absolute state distributions. These results refine the defect-state model of CdIn2S4 and clarify how annealing modifies trapping and recombination pathways.

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BibTeX
@article{zdzieblowski2026postdeposition,
  title = {{Post-deposition control of the defect landscape in CdIn2S4 thin films}},
  author = {Jakub Zdziebłowski and Nicolas Barreau and Paweł Zabierowski},
  journal = {Physica B: Condensed Matter},
  year = {2026},
  month = oct,
  doi = {10.1016/j.physb.2026.419207},
  url = {https://hal.science/hal-05730610v1},
  note = {CC BY-NC-ND 4.0},
}
RIS
TY  - JOUR
TI  - Post-deposition control of the defect landscape in CdIn2S4 thin films
AU  - Jakub Zdziebłowski
AU  - Nicolas Barreau
AU  - Paweł Zabierowski
PY  - 2026
DA  - 2026/10/08
JO  - Physica B: Condensed Matter
DO  - 10.1016/j.physb.2026.419207
UR  - https://hal.science/hal-05730610v1
AB  - We investigate the effect of post-deposition annealing on the defect-controlled electronic response of CdIn2S4 thin films using photocurrent-light-intensity analysis and transient photoconductivity. Relative to our previous annealing study, the present work extracts characteristic energy scales of the effective sub-bandgap states sampled under illumination and relates them to annealing-induced Fermi-level shifts. The determined characteristic energies are in the range of 40-16 meV and systematically evolve as a result of annealing. The measured Lux-Ampere characteristics evolve systematically from linear to sublinear behavior and, within the Rose and Bube formalisms, are consistent with reorganization of inversion-related antisite states and sulfur-vacancy-related defects. In the as-grown and vacuum-annealed films, the results support a distributed contribution of E states. Because the accessible energy window is limited by illumination range and Fermi-level position, the reconstructed profiles are interpreted as effective rather than absolute state distributions. These results refine the defect-state model of CdIn2S4 and clarify how annealing modifies trapping and recombination pathways.
SN  - 0921-4526
SN  - 1873-2135
ER  -